MARTÍNEZ-MARTÍNEZ, Liliana O.; 						LARRAMENDI, Erick M.; 						DE MELO, Osvaldo.
Determining the Thickness and Refractive Index of Epitaxial Thin Films of CdxZn(1-x)Se by means of the reflectance spectra.
<strong>Revista Cubana de Física</strong>, [S.l.], v. 23, n. 1, p. 25-29, july 2006.
ISSN 2224-7939.
Available at: &lt;<a href="https://revistacubanadefisica.org/index.php/rcf/article/view/RCF_23_1_25" target="_new">https://revistacubanadefisica.org/index.php/rcf/article/view/RCF_23_1_25</a>&gt;. Date accessed: 30 apr. 2024.