[1]
D. Rodríguez-Herrera, A. Pentón-Madrigal, and E. Estevez-Rams , Trans., “Use of Convolution Method at Linear Intervals in X-ray Diffraction Profiles”, Rev. Cubana Fis., vol. 41, no. 1, pp. 16–21, Jul. 2024, Accessed: Oct. 16, 2024. [Online]. Available: https://revistacubanadefisica.org/index.php/rcf/article/view/4