Martínez-Martínez, Liliana O., 		Larramendi, Erick M., AND 		de Melo, Osvaldo.
"Determining the Thickness and Refractive Index of Epitaxial Thin Films of CdxZn(1-x)Se by means of the reflectance spectra" <em>Revista Cubana de Física</em> [Online], Volume 23 Number 1 (1 July 2006)