Martínez-Martínez, ...., 		Larramendi, ...., & 		de Melo, ....
(2006).
Determining the Thickness and Refractive Index of Epitaxial Thin Films of CdxZn(1-x)Se by means of the reflectance spectra.
<em>Revista Cubana De FíSica, 23</em>(1), 25-29.
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